Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded...
29 KB (3,376 words) - 14:27, 7 May 2024
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated...
75 KB (9,806 words) - 04:32, 24 August 2024
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster...
33 KB (4,121 words) - 06:34, 13 September 2024
A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned...
47 KB (7,166 words) - 23:26, 29 June 2024
Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation...
24 KB (2,847 words) - 23:47, 21 July 2024
scanning microscopy and scanning electron microscopy). Scanning probe microscopy involves the interaction of a scanning probe with the surface of the...
69 KB (8,319 words) - 18:28, 30 October 2024
Scanning voltage microscopy (SVM), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A...
4 KB (456 words) - 03:28, 11 September 2024
force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy...
35 KB (4,141 words) - 01:39, 1 October 2024
Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local...
42 KB (5,218 words) - 06:46, 19 May 2024
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons...
67 KB (8,141 words) - 21:07, 20 October 2024
Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features...
9 KB (829 words) - 21:14, 6 April 2023
Scanning thermal microscopy (SThM) is a type of scanning probe microscopy that maps the local temperature and thermal conductivity of an interface. The...
11 KB (1,247 words) - 18:59, 10 January 2024
Scanning microscopy may refer to: Scanning probe microscopy Atomic force microscopy Scanning tunneling microscope Scanning electron microscope Scanning...
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Microscope (category Microscopy)
transmission electron microscope and the scanning electron microscope) and various types of scanning probe microscopes. Although objects resembling lenses...
31 KB (3,699 words) - 15:02, 20 May 2024
Scanning probe lithography (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write...
23 KB (2,364 words) - 19:35, 21 March 2024
Optical microscope (redirect from Optical microscopy)
optical microscopy which do not use visible light include scanning electron microscopy and transmission electron microscopy and scanning probe microscopy and...
52 KB (5,988 words) - 16:54, 17 October 2024
Scanning tunneling spectroscopy (STS), an extension of scanning tunneling microscopy (STM), is used to provide information about the density of electrons...
26 KB (3,641 words) - 21:28, 29 June 2024
2019. Retrieved 14 May 2011. Binnig, G.; Rohrer, H. (1986). "Scanning tunneling microscopy". IBM Journal of Research and Development. 30 (4): 355–69. "Press...
46 KB (5,111 words) - 13:52, 22 August 2024
Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. SICM allows for the determination...
15 KB (1,986 words) - 15:52, 26 June 2024
electron microscopy (EFTEM) High-resolution transmission electron microscopy (HRTEM) Scanning confocal electron microscopy (SCEM) Scanning electron microscope...
37 KB (4,263 words) - 03:06, 21 September 2024
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and...
50 KB (6,268 words) - 02:25, 27 December 2023
Nanotechnology (section Scanning microscopes)
are made. Scanning probe microscopy is an important technique both for characterization and synthesis. Atomic force microscopes and scanning tunneling...
69 KB (7,035 words) - 22:52, 18 October 2024
NanoWorld is the global market leader for tips for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The atomic force microscope (AFM) is the...
9 KB (769 words) - 19:08, 20 July 2024
The operation of a photon scanning tunneling microscope (PSTM) is analogous to the operation of an electron scanning tunneling microscope, with the primary...
26 KB (3,555 words) - 19:57, 28 December 2023
Scanning quantum dot microscopy (SQDM) is a scanning probe microscopy (SPM) that is used to image nanoscale electric potential distributions on surfaces...
12 KB (1,600 words) - 04:23, 27 December 2023
Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique...
46 KB (5,300 words) - 21:11, 20 October 2024
In condensed matter physics, scanning SQUID microscopy is a technique where a superconducting quantum interference device (SQUID) is used to image surface...
39 KB (5,448 words) - 06:46, 19 May 2024
Scanning Transmission Electron Microscopy (STEM) and Scanning Probe Microscopy (SPM) Lecture Series (YouTube playlist) Piezoresponse Force Microscopy...
12 KB (1,028 words) - 20:45, 3 July 2024
Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is positioned in contact or close proximity...
7 KB (892 words) - 07:17, 25 March 2023
of probe-based tools began with the invention of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), collectively called scanning probe...
72 KB (8,212 words) - 13:26, 17 August 2024